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Volumn 31, Issue 4, 2012, Pages 1509-1518

Accurate fitting of measured reflectances using a shifted gamma micro-facet distribution

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER GRAPHICS;

EID: 84879859817     PISSN: 01677055     EISSN: 14678659     Source Type: Journal    
DOI: 10.1111/j.1467-8659.2012.03147.x     Document Type: Article
Times cited : (73)

References (23)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.