Nuclear magnetic resonance reveals structural evolution upon annealing in epitaxial Co2MnSi Heusler films

Applied Physics Letters

Volumn 102, Issue 24, 2013, Pages

  Rodan, S ^a   Alfonsov, A ^a   Belesi, M ^a   Ferraro, F ^b   Kohlhepp, J T ^b   Swagten, H J M ^b   Koopmans, B ^b   Sakuraba, Y ^c   Bosu, S ^c   Takanashi, K ^c   Buchner B ^a,d   Wurmehl, S ^a,d  

^a IFW DRESDEN   (Germany)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c TOHOKU UNIVERSITY   (Japan)

^d DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; FIELD MEASUREMENT; HEUSLER; LONG RANGE ORDERS; MNSI FILMS; SMOOTH INTERFACE; STRUCTURAL EVOLUTION;

CARBON DIOXIDE; INTERFACES (MATERIALS); MAGNETORESISTANCE; NUCLEAR MAGNETIC RESONANCE;

ANNEALING;

EID: 84879836396     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4811244     Document Type: Article

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21. See supplementary material at http://dx.doi.org/10.1063/1.4811244 E-APPLAB-102-001325 for details of the NMR setup and experiments, details of P2, discussion on NMR signatures for other orderings, and details on spectra and analysis.