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Volumn , Issue , 2008, Pages
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Microstructure characterization of Mo back contact used for CIGS based solar cell
a,b b b b |
Author keywords
[No Author keywords available]
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Indexed keywords
DIRECT-CURRENT;
GLASS SUBSTRATES;
HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES;
MICROSTRUCTURE CHARACTERIZATION;
OUT-DIFFUSION;
SODA LIME GLASS SUBSTRATE;
SPUTTERING POWER;
SPUTTERING PRESSURES;
GLASS;
MORPHOLOGY;
POROSITY;
SCANNING ELECTRON MICROSCOPY;
SECONDARY ION MASS SPECTROMETRY;
SODIUM;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
SUBSTRATES;
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EID: 84879734426
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2008.4922873 Document Type: Conference Paper |
Times cited : (5)
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References (12)
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