Electrical and chemical characterization of chemically passivated silicon surfaces

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2008, Pages

  Chhabra, Bhumika ^a   Suzer, Sefik ^b   Opila, Robert L ^a   Honsberg, Christiana B ^a  

^a UNIVERSITY OF DELAWARE   (United States)

^b BILKENT UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL CHARACTERIZATION; FTIR TECHNIQUES; HF TREATMENT; INERT SURFACES; MINORITY CARRIER LIFETIMES; SILICON SUBSTRATES; SILICON SURFACES;

METHANOL;

PASSIVATION;

EID: 84879721499     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2008.4922673     Document Type: Conference Paper

References (6)

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2. R. A. Sinton, A. Cuevas, and M. Stuckings, "Quasi-Steady-State Photoconductance, A New Method for Solar Cell Material and Device Characterization, " Proc of the 25th IEEE Photovoltaic Specialists Conference, pp. 457-460, 1996.
3. M. J. Kerr and A. Cuevas, "Very Low Bulk and Surface Recombination in Oxidized Silicon Wafers" Semi. Sci. and Tech., 17, pp. 35-38, (2002).
4. M. J. Kerr, Ph. D. Thesis, Australian National University, "Surface, Emitter and Bulk Recombination in Silicon and Development of Silicon Nitride Passivated Solar Cells", (2002).
5. Renee T. Mo, Tracey A Burr, Gregory T. Merklin, Francisco Machuca, Piero A. Pianetta, Lionel C. Kimerling, Ronald P. Chiarello and Christopher E. D. Chidsey, " Atomic-Sacle Mechanistic Study of Iodine/Alcohol Passivated SI (100)", 19tfh Meeting of the Electrochemical Society, SLAC-PUB-8262, Sep (1999).
6. Briggs, D., Seah, M. P. "Practical Surface Analysis, Vol. I", 2nd Ed. Wiley, Chichester (1990).