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Volumn , Issue , 2008, Pages
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The use of test structures for characterization of back-contact silicon solar cells
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Author keywords
[No Author keywords available]
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Indexed keywords
DEVICE GEOMETRIES;
DEVICE PERFORMANCE;
EMITTER-WRAP-THROUGH;
PRODUCTION LINE;
RECOMBINATION CURRENTS;
SERIES RESISTANCES;
SPECIFIC COMPONENT;
TEST STRUCTURE;
ELECTRIC RESISTANCE;
SILICON SOLAR CELLS;
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EID: 84879721034
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2008.4922755 Document Type: Conference Paper |
Times cited : (3)
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References (8)
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