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Volumn 87, Issue 23, 2013, Pages

Robustness of two-dimensional topological insulator states in bilayer bismuth against strain and electrical field

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EID: 84879715129     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.87.235420     Document Type: Article
Times cited : (100)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.