New generation of PV module rating by LED solar simulator - A novel approach and its capabilities

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2008, Pages

  Tsuno, Yuki ^a   Koichi Kamisako, ^a   Kurokawa, Kosuke ^a  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOCATION PATTERNS; HIGH BRIGHTNESS; REFERENCE VALUES; SINGLE CRYSTALLINE SILICON; SPECTRAL CHARACTERISTICS; SPECTRAL COMPONENTS; SPECTRAL RESPONSE; SPECTRAL SENSITIVITY;

LIGHT SOURCES; PHOTOVOLTAIC CELLS; SPECTROSCOPY;

LIGHT EMITTING DIODES;

EID: 84879708378     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2008.4922582     Document Type: Conference Paper

References (5)

1. S. Kohraku, Kosuke Kurokawa: New methods for solar cell measurement by LED solar simulator, WCPEC-3, Osaka, 11-18 May, 2003
2. S. Kohraku, K. Kurokawa: New method for solar cells measurement using LED, PVSEC-14, Bangkok, 2004. 1. 26-30, P029VI/1-170.
3. J. Koyanagi, K. Kurokawa: A fundamental experiment of solar cell's I-V characteristics measurement using LED solar simulator, Renewable Energy 2006, Makuhari, 2006. 10. 10-13, P-PV-9.
4. Y. Tsuno, Y. Hishikawa, K. Kurokawa: Temperature and irradiance dependence of the I-V curves of various kinds of solar cells, PVSEC-15, Shanghai, 14 Oct. 2005, p. 422-423.
5. Y. Tsuno, Y. Hishikawa, K. Kurokawa: Translation equations for temperature and irradiance of the I-V curves of various PV cells and modules, WCPEC-4, Hawaii, 7-12 May 2006, p. 2246-2249.