The effect of cell thickness on module reliability

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2008, Pages

  Wohlgemuth, John H ^a   Cunningham, Daniel W ^a   Placer, Neil V ^a   Kelly, George J ^a   Nguyen, Andy M ^a  

^a BP Solar International ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED STRESS; CELL THICKNESS; CRYSTALLINE SILICON CELLS; DAMAGED CELLS; DYNAMIC MECHANICAL; MECHANICAL LOADS; MODULE RELIABILITY; QUALIFICATION TEST;

CELLS; CRACKS; CYTOLOGY; DYNAMIC LOADS; DYNAMICS; PHOTOVOLTAIC CELLS; STRESSES;

LOAD TESTING;

EID: 84879706833     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2008.4922770     Document Type: Conference Paper

References (4)

1. IEC 61215 "Crystalline Silicon Terrestrial Photovoltaic Modules-Design Qualification and Type Approval" edi-tion 2, 2005.
2. IEEE 1262 "IEEE Recommended Practice for Qualifi-cation of Photovoltaic (PV) Modules" 1995.
3. JPL 5101-19 "Cyclic Pressure-Load Developmental Testing of Solar Panels", 1977.
4. P. Grunow, S. Krauter, S. Lehmann and J. Arp "Module technology: Test Analysis of Modules via Electro-luminescence" Proceedings of Staffelstein Conference, 2007.