A new real-time quantum efficiency measurement system

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2008, Pages

  Young, David L ^a   Egaas, Brian ^a,b   Pinegar, Scott ^a   Stradins, Paul ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Department of Geology and Geological Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FULL-SPECTRUM LIGHT; MANUFACTURING ENVIRONMENTS; MEASUREMENT SPEED; MEASUREMENT TECHNIQUES; MODULATION FREQUENCIES; PARALLEL PROCESSING; QUANTUM EFFICIENCY MEASUREMENTS; SPECTRAL RESPONSE;

FREQUENCY BANDS; LIGHT SOURCES; QUANTUM EFFICIENCY;

INSTRUMENTS;

EID: 84879704010     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2008.4922748     Document Type: Conference Paper

References (4)

1. Basore, P. A., Numerical Modeling of Textured Silicon Solar Cells Using PC-1D. IEEE Transactions on electron devices, 37(2):1990 p337.
2. Hovel, H. J., Semiconductors and semimetals" Vol. II. Academic Press, New York, 1975.
3. Bucher, K. and Schonecker, A., 1991. Spectral response measurements of mult-junction solar cells with a grating monochromator and a fourier spectrometer. In: A. luque, G. Sala, W. Palz, G. Dos Santos and P. Helm (Editors), 10th European photovoltaic solar energy conference, Lisbon, Portugal, pp. 107-110.
4. Sze, S. M. and NG, K. K., Physics of Semiconductor Devices. John Wiley & Sons, INC, Hoboken, 2007 pp 815