Subsurface detection of small voids in low-loss solids

SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference

Volumn , Issue , 2001, Pages 281-284

  Buechler, D N ^a   Misra, D K ^a  

^a University of Wisconsin Milwaukee   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PROBES; VENEERS;

COAXIAL PROBE; LOW-LOSS; OPEN-ENDED COAXIAL PROBE; SHALLOW DEPTHS; SUBSURFACE DEFECT; SUBSURFACE LAYER; SUBSURFACE VOIDS; WOOD VENEER;

DEFECTS;

EID: 84879691598     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SFICON.2001.968544     Document Type: Conference Paper

References (10)

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