An aspect-oriented model to monitor misuse

Innovations and Advanced Techniques in Computer and Information Sciences and Engineering

Volumn , Issue , 2007, Pages 273-278

  Padayachee, K ^a   Eloff, J H P ^b  

^a UNIVERSITY OF SOUTH AFRICA   (South Africa)

^b UNIVERSITY OF PRETORIA   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

INTRUSION DETECTION;

ASPECT ORIENTATION; ASPECT ORIENTED MODELING; ASPECT-ORIENTED PARADIGMS; CODE COMPLEXITY; INFORMATION FLOWS; MISUSE DETECTION; PATTERN SIGNATURE; SOFTWARE SECURITY;

OBJECT ORIENTED PROGRAMMING;

EID: 84879663600     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-1-4020-6268-1_49     Document Type: Conference Paper

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