Accurate determination of the vapor-liquid-solid contact line tension and the viability of Young equation

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Liu, Yawei ^a   Wang, Jianjun ^b   Zhang, Xianren ^a  

^a BEIJING UNIVERSITY OF CHEMICAL TECHNOLOGY   (China)

^b INSTITUTE OF CHEMISTRY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84879632118     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep02008     Document Type: Article

References (30)

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