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Volumn 18, Issue 6, 2013, Pages

Fast optical sectioning obtained by structured illumination microscopy using a digital mirror device

Author keywords

fluorescence; high throughput imaging; optical sectioning; three dimensional microscopy

Indexed keywords

COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; CONNECTIVITY INFORMATION; DIFFRACTION-LIMITED RESOLUTION; HIGH-THROUGHPUT IMAGING; OPTICAL SECTIONING; STRUCTURED ILLUMINATION MICROSCOPIES (SIM); STRUCTURED ILLUMINATION MICROSCOPY; THREE-DIMENSIONAL MICROSCOPY;

EID: 84879609181     PISSN: 10833668     EISSN: 15602281     Source Type: Journal    
DOI: 10.1117/1.JBO.18.6.060503     Document Type: Article
Times cited : (45)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.