Electronic characterization of single-layer MoS2 sheets exfoliated on SrTiO3

Materials Research Society Symposium Proceedings

Volumn 1474, Issue , 2012, Pages 30-34

  Bußmann, Benedict Kleine ^a   Marinov, Kolyo ^a   Ochedowski, Oliver ^a   Scheuschner, Nils ^b   Maultzsch, Janina ^b   Schleberger, Marika ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CHARACTERIZATION; KELVIN PROBE; KELVIN PROBE FORCE MICROSCOPY; PL MEASUREMENTS; SINGLE LAYER; SRTIO;

CARRIER CONCENTRATION; CHARACTERIZATION; ENERGY GAP; INTERFACES (MATERIALS); PROBES; STRONTIUM TITANATES;

MOLYBDENUM COMPOUNDS;

EID: 84879524875     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/opl.2012.1463     Document Type: Conference Paper

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