Impurity (Fe, Cl, and P)-induced grain boundary and secondary phases in commercially pure titanium (CP-Ti)

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 44, Issue 8, 2013, Pages 3961-3969

  Yan, M ^a   Luo, S D ^a   Schaffer, G B ^a   Qian, M ^a  

^a UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIALLY PURE TITANIUMS; IMPURITY LEVEL; NANOPRECIPITATES; PHASE MATERIALS; POTENTIAL IMPACTS; SECONDARY PHASIS; TETRAGONAL CRYSTAL STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY (TEM);

GRAIN BOUNDARIES; MICROSTRUCTURE; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

TITANIUM METALLOGRAPHY;

EID: 84879417856     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-013-1720-0     Document Type: Article

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