The effect of surface roughness on the determination of optical constants of CuInSe2 and CuGaSe2 thin films

Journal of Applied Physics

Volumn 113, Issue 21, 2013, Pages

  Yin, G ^a   Merschjann, C ^a,b   Schmid, M ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX REFRACTIVE INDEX; LOW SURFACE ROUGHNESS; TRANSFER MATRIXES;

ATOMIC FORCE MICROSCOPY; OPTICAL CONSTANTS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; SURFACE ROUGHNESS; THIN FILMS;

TRANSFER MATRIX METHOD;

EID: 84879375094     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4809550     Document Type: Article

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