Radiation fault modeling and fault rate estimation for a COTS based space-borne supercomputer

IEEE Aerospace Conference Proceedings

Volumn 5, Issue , 2002, Pages 2121-2131

  Karapetian, Arbi V ^a   Some, Raphel R ^a   Beahan, John J ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARCHITECTURAL ANALYSIS; COMMERCIAL OFF-THE SHELVES; ENVIRONMENTAL DATA; FUTURE TECHNOLOGIES; OPTIONAL PARAMETERS; RADIATION TESTING; REMOTE EXPLORATIONS; SINGLE EVENT UPSETS;

COMPUTER PERIPHERAL EQUIPMENT; DYNAMIC RANDOM ACCESS STORAGE; NASA; STATIC RANDOM ACCESS STORAGE;

SUPERCOMPUTERS;

EID: 84879366593     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2002.1035378     Document Type: Conference Paper

References (8)

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2. G. Swift, S. Guertin, F. Farmanesh, F. Irom, D. Millward, "Single-Event Upset in the Power PC750 Microprocessor" IEEE TNS Dec. 2001
3. G. Swift, S. Guertin, F. Farmanesh, Jet Propulsion Laboratory, "Measurements of the PowerPC750 Upset Susceptibility to Protons and Heavy Ions" RADECS 2000
4. J.L.Barth, Modeling Space Radiation Environments, Section 1 of the Short Course presented at the IEEE Nuclear and Space Radiation Effects Conference, Snowmass, Colorado, July 21, 1997
5. G. Swift, S. Guertin Jet Propulsion Laboratory, "In-Flight Observations of Multiple-Bit Upset in DRAMs" Nuclear and Space Radiation Effects Conference, 2000
6. JPL Electronic Parts Engineering RadData Server http://radnet.iol.nasa. gov
7. A. H. Johnston, Jet Propulsion Laboratory, "Radiation Effects in Advanced Microelectronic Technologies," IEEE Trans. Nucl. Sei., 45, p. 1339-1354,1998. (Pubitemid 128739203)
8. Motorola Power PC 750 Users Manual