Artifacts in Kirchho common image gathers

SEG Technical Program Expanded Abstracts

Volumn 21, Issue 1, 2002, Pages 1129-1132

  Stolk, Christiaan C ^a   Symes, William W ^a  

^a RICE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84879288245     PISSN: 10523812     EISSN: 19494645     Source Type: Conference Proceeding    
DOI: 10.1190/1.1816846     Document Type: Conference Paper

References (15)

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