Apparent increase in the thickness of superconducting particles at low temperatures measured by electron holography

Ultramicroscopy

Volumn 133, Issue , 2013, Pages 67-71

  Hirsch, J E ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Electron holography; Interference micrograph; Superconductors; Thickness measurement

Indexed keywords

ELECTRON WAVE; ELECTRONIC WAVE FUNCTIONS; LOW TEMPERATURES; MEAN INNER POTENTIAL; NEGATIVE CHARGE; SUPERCONDUCTING PARTICLES; SUPERCONDUCTING STATE; TEMPERATURE DEPENDENCE;

ELECTRON HOLOGRAPHY; PHASE SHIFT; SUPERCONDUCTING MATERIALS; THICKNESS MEASUREMENT; WAVEFRONTS;

SUPERCONDUCTIVITY;

ARTICLE; CALCULATION; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD; ELECTRIC POTENTIAL; ELECTRON; ELECTRON TRANSPORT; HOLOGRAPHY; LOW TEMPERATURE; MATHEMATICAL COMPUTING; PARTICLE SIZE; SUPERCONDUCTOR;

ELECTRON HOLOGRAPHY; INTERFERENCE MICROGRAPH; SUPERCONDUCTORS; THICKNESS MEASUREMENT;

COLD TEMPERATURE; ELECTRIC CONDUCTIVITY; ELECTRONS; HOLOGRAPHY; PARTICLE SIZE; TEMPERATURE;

EID: 84879283236     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.05.007     Document Type: Article

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