Low temperature reliability of carbon nanotube/silicone superhydrophobic coatings

44th International Symposium on Microelectronics 2011, IMAPS 2011

Volumn 2, Issue , 2011, Pages 857-860

  Sohn, Yoonchul ^a   Lee, Sangeui ^a   Kim, Dongouk ^a   Chu, Kunmo ^a   Kim, Dongun ^a   Kim, Hajin ^a   Han, Intaek ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84879131515     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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