Diagnostics and prognostics method for analog electronic circuits

IEEE Transactions on Industrial Electronics

Volumn 60, Issue 11, 2013, Pages 5277-5291

  Vasan, Arvind Sai Sarathi ^a   Long, Bing ^b   Pecht, Michael ^a,c  

^a UNIVERSITY OF MARYLAND   (United States)

^b UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^c CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Analog circuits; Least squares support vector machines (SVMs) (LS SVMs); Parametric faults; Particle filters (PFs)

Indexed keywords

MONTE CARLO METHODS; PATTERN RECOGNITION; SIGNAL FILTERING AND PREDICTION; SUPPORT VECTOR MACHINES;

ANALOG ELECTRONIC CIRCUIT; DIAGNOSTICS AND PROGNOSTICS; INDUSTRIAL SYSTEMS; LEAST SQUARES SUPPORT VECTOR MACHINES; PARAMETRIC FAULT; PARTICLE FILTERS (PFS); PATTERN RECOGNITION PROBLEMS; SUCCESSIVE REFINEMENT;

ANALOG CIRCUITS;

EID: 84879096158     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2012.2224074     Document Type: Article

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