Dynamic measuring of inductivity changes by adaptive controlling and lock-in technique

Journal of Electrical Engineering

Volumn 55, Issue 10 SUPPL, 2005, Pages 49-52

  Kaniusas, Eugenijus ^a   Pfützner, Helmut ^a   Mehnen, Lars ^a   Kosel, Jürgen ^a   Meydan, Turgut ^b   Vázquez, Manuel ^c   Rohn, Michael ^d   Merlo, Alberto Maria ^e   Marquardt, Bernd ^f  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b CARDIFF UNIVERSITY   (United Kingdom)

^c INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^d Profactor   (Austria)

^e CENTRO RICERCHE FIAT   (Italy)

^f ELCAT ^*  (Germany)

Author keywords

Adaptive controlling; Dynamic resolution; Inductivity measurement; Offset compensation; Sensors

Indexed keywords

EID: 84879056360     PISSN: 13353632     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (1)

1. MEHNEN, L., KANIUSAS, E., KOSEL, J., Tellez-Blanco, J. C., PFÜTZNER, H., MEYDAN, T., VAZQUEZ, M., ROHN, M., MALVICINO, C., MARQUARDT, B.: Magnetostrictive Bilayer Sensors A Survey, J. Alloys and Compounds 369 (2003), 202-204.