Characterization of magneto-impedance thin film microstructures

Journal of Electrical Engineering

Volumn 55, Issue 10 SUPPL, 2005, Pages 11-15

  Giouroudi, I ^a,b   Hauser, Hans ^a   Daalmans, G ^a   Rieger, G ^a   Wecker, J ^b  

^a SIEMENS AG   (Germany)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Complex permeability; Magnetic thin film; Magnetooptical Kerr effect; Tri layer structure

Indexed keywords

EID: 84879045126     PISSN: 13353632     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

1. H. Hauser, L. Kraus, P. Ripka, "Giant Magnetoimpedance Sensors", IEEE Instr.&Meas. Mag. (June 2001) 28-32.
2. L. V. Panina et al., IEEE Trans. Magn. 31 (1995) 1249.
3. L. V. Panina et al., J. Appl. Phys. 89 (2001) 7221.
4. J. M. Barandiaran et al., IEEE Trans. Magn. 38 (2002) 3051.
5. G. V. Kurlyandskaya et al., Appl. Phys. Lett. 82 (2003) 3053.
6. T. Uchiyama et al., IEEE Trans. Magn. 31 (1995) 3182.
7. T. Morikawa, Y. Nishibe, H. Yamadera, Y. Nonomura, M. Takeuhci, Y. Taga,"Giant magnetoimpedance effect in layered thin films", IEEE Trans. Magn. (1997) 4367.
8. L. V. Panina, K. Mohri, K. Bushida, M. Noda, "Giant magnetoimpedance and magnetoinductive effects in amorphous alloys", J. Appl. Phys. (1996) 6198.
9. A. Gromov et al., IEEE Trans. Magn. 34 (1998) 1246.
10. A. Hubert, R. Schäfer, "Magnetic Domains", Berlin, Springer (1998).