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Volumn 124, Issue 16, 2013, Pages 2345-2348

Study on structural, optical and electrical properties of CdS 0.5Se0.5 thin films for photovoltaic applications

Author keywords

Composites; Electrical properties; Optical properties; X ray diffraction

Indexed keywords

ELECTRICAL RESISTIVITY; OPTICAL AND ELECTRICAL PROPERTIES; OPTIMUM CONDITIONS; PHOTOVOLTAIC APPLICATIONS; PREFERENTIAL ORIENTATION; REFLECTION SPECTRA; SCREEN PRINTING METHODS; X-RAY DIFFRACTION STUDIES;

EID: 84879014240     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijleo.2012.06.094     Document Type: Article
Times cited : (36)

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    • Mane, R.S.1    Lokhande, C.D.2
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    • P.K. Kalita, B.K. Sharma, and H.L. Das Structural and photoelectronic properties of vacuum evaporated CdSe thin films Ind. J. Phys. 77 2003 225 231
    • (2003) Ind. J. Phys. , vol.77 , pp. 225-231
    • Kalita, P.K.1    Sharma, B.K.2    Das, H.L.3
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    • Effect of air annealing on structural, optical, microscopic, electrical properties of cadmium selenide thin films
    • P.P. Hankare, P.A. Chate, D.J. Sathe, and A.A. Patil Effect of air annealing on structural, optical, microscopic, electrical properties of cadmium selenide thin films J. Mater. Sci. Mater. Electron. 20 2009 776 781
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    • Band gap measurement in thick films using reflection spectroscopy
    • V. Kumar, S.K. Sharma, T.P. Sharma, and V. Singh Band gap measurement in thick films using reflection spectroscopy Opt. Mater. 12 1999 115 119
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    • The electrical properties of polycrystalline silicon films
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.