SCOPUS 정보 검색 플랫폼

Volumn 84, Issue 5, 2013, Pages

Optical design of the short pulse x-ray imaging and microscopy time-angle correlated diffraction beamline at the Advanced Photon Source

(7) Reininger, R a Dufresne, E M a Borland, M a Beno, M A a Young, L a Kim, K J a Evans, P G b

a ARGONNE NATIONAL LABORATORY (United States)

b University of Wisconsin Madison (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED PHOTON SOURCE; DOUBLE CRYSTAL MONOCHROMATORS; ENERGY RESOLUTIONS; KIRKPATRICK-BAEZ MIRROR; LINEAR CORRELATION; REPETITION RATE; SAMPLE POSITION; X-RAY BEAMLINES;

ELECTRON BEAMS; ELEMENTARY PARTICLE SOURCES; MONOCHROMATORS; OPTICAL DESIGN; X RAY ANALYSIS;

DIFFRACTION;

EID: 84878954281 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.4804197 Document Type: Article

Times cited : (4)

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