Effect of thickness on structural, optical and magnetic properties of Co doped ZnO thin film by pulsed laser deposition

Journal of Optoelectronics and Advanced Materials

Volumn 15, Issue 3-4, 2013, Pages 239-243

  Kamalianfar, A ^a,b   Halim, S A ^a   Behzad, Kasra ^a   Naseri, Mahmoud Goodarz ^a   Navasery, M ^a   Din, Fasih Ud ^a   Zahedi, J A M ^c   Lim, K P ^a   Chen, S K ^a   Sidek, H A A ^a  

^a UNIVERSITY PUTRA MALAYSIA   (Malaysia)

^b University of Jahrom   (Iran)

^c ISLAMIC AZAD UNIVERSITY   (Iran)

Author keywords

Co doped ZnO; Dilute magnetic semiconductor; PLD; Thin Film

Indexed keywords

COBALT; FILM PREPARATION; FILM THICKNESS; II-VI SEMICONDUCTORS; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; MAGNETISM; NEODYMIUM LASERS; OPTICAL PROPERTIES; OXIDE MINERALS; PULSED LASER DEPOSITION; PULSED LASERS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR LASERS; SOLS; WIDE BAND GAP SEMICONDUCTORS; YTTRIUM ALUMINUM GARNET; ZINC OXIDE;

CO-DOPED ZNO; DILUTE MAGNETIC SEMICONDUCTORS; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; MAGNETIC PROPERTIES OF CO; NEODYMIUM DOPED YTTRIUM ALUMINUM GARNET; PULSE DURATIONS; UV-VIS SPECTROMETRY; VIBRATING SAMPLE MAGNETOMETER;

THIN FILMS;

EID: 84878774069     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)

1. M. Venkatesan, C. B. Fitzgerald, J. G. Lunney, J. M. D. Coey, Phys. Rev. Lett. 93, 177206 (2004).
2. K. Ando, H. Saito, Z-W. Jin, T. Kukumura, et al. Appl. Phys. Lett. 78, 2700 (2001).
3. P.V. Radovanovic, D.R. Gamelin, Phys. Rev. Lett. 91, 157202 (2003).
4. H. Saeki, H. Tabata, T. Kawai, Solid-State Commun. 120, 439 (2001).
5. K. Sato and H. Katayama-Yoshida, Jpn. J. Appl. Phys. 39, L555 (2000).
6. T. Shi, S. Zhu, Z. Sun, S. Wei, and W. Liu, Appl. Phys. Lett. 90, 102108 (2007).
7. F-Z. Ghomrani, S. Iftimie, N. Gabouze, A. Serier, M. Socol, A. Stanculescu, F. Sanchez, S. Antohe, M. Girtan, J Optoelectron. Adv. Mater. 5, 257 (2011).
8. S. Pilban Jahromi, N.M. Huang, A. Kamalianfar, H.N. Lim, M.R. Muhamad, R. Yousefi, Journal of Nanomaterials 2012, 173825 (2012).
9. K. Samanta, P. Bhattacharya, R. S. Katiyar, W. Iwamoto, P. G. Pagliuso, and C. Rettori, Phys. Rev. B 73, 245213 (2006).
10. J. H. Kim, H. Kim, D. Kim, Y. E. Ihm, W. K. Choo, Physica B. 327, 304 (2002).
11. A. Kamalianfar, S.A. Halim, S.P. Jahromi, M. Navasery, F.U. Din, K.P. Lim, S.K. Chen, J.A.M. Zahedi, Chinese. Phys. Lett. 29(12), 128102 (2012).
12. A. Khorsand Zak, M. Ebrahimizadeh Abrishami, W. H. Abd Majid, Ramin Yousefi, S. M. Hosseini, Cer. Inter. 37, 393 (2011).
13. J. Zhang, X.Z. Li, B. Xu, D.J. Sellmyer, Appl. Phys. Lett. 86, 212504 (2005).
14. H.J. Lee, S.Y. Jeong, C.R. Cho, C.H. Park, Appl. Phys. Lett. 81, 4020 (2002).
15. B.D. Cullity & S.R. Stock, Elements of X-Ray Diffraction, 3rd Ed., Prentice-Hall Inc. (2001).
16. G.B. Williamson, R.C. Smallman, Philos. Mag. 1, 34 (1956).
17. T. Story, R. R. Galazka, R. B. Frankel, P. A. Wolff, Phys. Rev. Lett. 56, 777 (1986).
18. T. Dietl, J. Phys.: Condens. Matter. 19, 165204 (2007).
19. Q. Liu, C.L. Yuan, C.L. Gan, G. Han, J. Appl. Phys. 110, 033907 (2011).
20. T. Dietl, T. Andrearczyk, A Lipínska, M Kiecana, M Tay and Wu, Phys. Rev. B 76, 155312 (2007).