Radiation effects studies on thin film TiO2 memristor devices

IEEE Aerospace Conference Proceedings

Volumn , Issue , 2013, Pages

  Deionno, Erica ^a   Looper, Mark D ^a   Osborn, Jon V ^a   Barnaby, Hugh J ^b   Tong, William M ^c,d  

^a AEROSPACE CORPORATION   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c TransEL Corporation   (United States)

^d KLA TENCOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL PERFORMANCE; ENERGY DEPOSITIONS; MEMORY APPLICATIONS; MEMRISTOR; RADIATION SOURCE; RADIATION TESTING; TIO;

DEPOSITION; MEMRISTORS; PASSIVE FILTERS; SPACE APPLICATIONS; THIN FILM DEVICES; TITANIUM DIOXIDE;

RESISTORS;

EID: 84878706383     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2013.6497378     Document Type: Conference Paper

References (17)

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