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Optics Letters

Volumn 38, Issue 10, 2013, Pages 1724-1726

Phase aberration compensation in digital holographic microscopy based on principal component analysis

(4) Zuo, Chao a,b Chen, Qian a Qu, Weijuan c Asundi, Anand b

a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY (China)

b NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

c DEPARTMENT OF ELECTRONICS AND COMPUTER ENGINEERING (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

COMPENSATING PHASE; DIGITAL HOLOGRAPHIC MICROSCOPY; DIGITAL HOLOGRAPHY; FIRST PRINCIPAL COMPONENTS; PHASE ABERRATIONS; PRINCIPAL COMPONENTS; PRIOR KNOWLEDGE; TIME-CRITICAL;

COMPUTER GENERATED HOLOGRAPHY; MICROSCOPIC EXAMINATION; PHASE MEASUREMENT;

PRINCIPAL COMPONENT ANALYSIS;

EID: 84878653741 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.38.001724 Document Type: Article

Times cited : (180)

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