Kinetic modeling of dissolution and crystallization of slurries with attenuated total reflectance UV-visible absorbance and near-infrared reflectance measurements

Analytical Chemistry

Volumn 85, Issue 11, 2013, Pages 5367-5375

  Hsieh, Chun H ^a   Billeter, Julien ^a   McNally, Mary Ellen P ^b   Hoffman, Ronald M ^b   Gemperline, Paul J ^a  

^a EAST CAROLINA UNIVERSITY   (United States)

^b DUPONT COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATED TOTAL REFLECTANCE; KINETICS OF CRYSTALLIZATION; NEAR INFRARED REFLECTANCE; NEAR INFRARED SPECTRA; PARAMETERS ESTIMATED; PHARMACEUTICAL MANUFACTURING PROCESS; SPECTROSCOPIC MEASUREMENTS; TIME-RESOLVED PROFILES;

BATCH REACTORS; CRYSTAL GROWTH; CRYSTALLIZATION KINETICS; DATA FUSION; DISSOLUTION; INFRARED DEVICES; KINETIC THEORY; RATE CONSTANTS; REFLECTION; SLURRIES;

KINETICS;

EID: 84878637923     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac302766m     Document Type: Article

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