Total variation minimization approach in in-line x-ray phase-contrast tomography

Optics Express

Volumn 21, Issue 10, 2013, Pages 12185-12196

  Kostenko, Alexander ^a   Batenburg, K Joost ^b,c,d   King, Andrew ^e   Offerman, S Erik ^a   Van Vliet, Lucas J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b CWI   (Netherlands)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d LEIDEN UNIVERSITY   (Netherlands)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGEBRA; LINEAR SYSTEMS;

ALGEBRAIC RECONSTRUCTION; CLOSED FORM SOLUTIONS; LINEAR SYSTEM OF EQUATIONS; RECONSTRUCTION PROBLEMS; REGULARIZATION TECHNIQUE; TOMOGRAPHIC RECONSTRUCTION; TOTAL VARIATION MINIMIZATION; X-RAY PHASE-CONTRAST TOMOGRAPHY;

ALGORITHMS;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER ASSISTED TOMOGRAPHY; IMAGE QUALITY; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; PROCEDURES;

ALGORITHMS; RADIOGRAPHIC IMAGE ENHANCEMENT; RADIOGRAPHIC IMAGE INTERPRETATION, COMPUTER-ASSISTED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TOMOGRAPHY, X-RAY COMPUTED;

EID: 84878568258     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.012185     Document Type: Article

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