Electromagnetically induced transparency and slow light in two-mode optomechanics

Optics Express

Volumn 21, Issue 10, 2013, Pages 12165-12173

  Jiang, Cheng ^a   Liu, Hongxiang ^a,b   Cui, Yuanshun ^a   Li, Xiaowei ^a   Chen, Guibin ^a   Chen, Bin ^c  

^a HUAIYIN NORMAL UNIVERSITY   (China)

^b NORTHEAST NORMAL UNIVERSITY   (China)

^c TAIYUAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

PROBES;

DESTRUCTIVE INTERFERENCE; ELECTROMAGNETICALLY INDUCED TRANSPARENCY; INDUCED TRANSPARENCY; MECHANICAL RESONATORS; OPTO-MECHANICAL SYSTEMS; OPTO-MECHANICS; TRANSMISSION SPECTRUMS; TWO-CAVITY;

TRANSPARENCY;

COMPUTER SIMULATION; DEVICE FAILURE ANALYSIS; DEVICES; ELECTROMAGNETIC FIELD; EQUIPMENT DESIGN; MECHANICAL STRESS; MICROELECTROMECHANICAL SYSTEM; REFRACTOMETRY; SURFACE PLASMON RESONANCE; THEORETICAL MODEL; TRANSDUCER; ARTICLE; EQUIPMENT; EQUIPMENT FAILURE;

COMPUTER SIMULATION; ELECTROMAGNETIC FIELDS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICRO-ELECTRICAL-MECHANICAL SYSTEMS; MODELS, THEORETICAL; REFRACTOMETRY; STRESS, MECHANICAL; SURFACE PLASMON RESONANCE; TRANSDUCERS;

EID: 84878560383     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.012165     Document Type: Article

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