Single-view metrology: Algorithms and applications (invited paper)

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 2449 LNCS, Issue , 2002, Pages 224-239

  Criminisi, Antonio ^a  

^a MICROSOFT RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION; ALGORITHMS; UNITS OF MEASUREMENT;

GEOMETRIC INFORMATION; LEVEL OF AUTOMATIONS; PERSPECTIVE IMAGE; RECONSTRUCTION PROCESS; SINGLE VIEW METROLOGY; UNCALIBRATED IMAGES; FORENSIC SCIENCE;

IMAGE PROCESSING;

EID: 84878533383     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-45783-6_28     Document Type: Conference Paper

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