A MEMS-based pyramid micro-needle electrode for long-term EEG measurement

Microsystem Technologies

Volumn 19, Issue 2, 2013, Pages 269-276

  Wang, Long Fei ^a   Liu, Jing Quan ^a   Yan, Xiao Xiao ^a   Yang, Bin ^a   Yang, Chun Sheng ^a  

^a Shanghai Jiao Tong University   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ELECTROENCEPHALOGRAPHY; ELECTROMECHANICAL DEVICES; MEMS; NEEDLES; WET ETCHING;

BIOPOTENTIAL ELECTRODES; ELECTRO-ENCEPHALOGRAM (EEG); ISOTROPIC WET ETCHING; LONG TIME MEASUREMENTS; MICROELECTROMECHANICAL SYSTEMS PROCESS; POWER SPECTRUM DENSITY; SIGNAL QUALITY; SKIN ELECTRODES;

ELECTRODES;

EID: 84878528425     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00542-012-1638-2     Document Type: Article

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