A new generation of X-ray baggage scanners based on a different physical principle

Materials

Volumn 4, Issue 10, 2011, Pages 1846-1860

  Ignatyev, Konstantin ^a   Munro, Peter R T ^a   Chana, Deeph ^b   Speller, Robert D ^a   Olivo, Alessandro ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b Department for Transport ^*  (United Kingdom)

Author keywords

Baggage scanners; Phase contrast imaging; X ray phase; X ray refraction

Indexed keywords

ATTENUATION CHARACTERISTICS; BAGGAGE SCANNERS; CURRENT TECHNOLOGY; INDIVIDUAL OBJECTS; PHASE-CONTRAST IMAGING; PHYSICAL PRINCIPLES; X-RAY PHASE; X-RAY REFRACTION;

OBJECT RECOGNITION; REFRACTION; SCANNING;

X RAYS;

EID: 84878343873     PISSN: None     EISSN: 19961944     Source Type: Journal    
DOI: 10.3390/ma4101846     Document Type: Article

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