Non-destructive lateral mapping of the thickness of the photoactive layer in polymer-based solar cells

Progress in Photovoltaics: Research and Applications

Volumn 21, Issue 4, 2013, Pages 402-419

  Sylvester Hvid, Kristian O ^a   Tromholt, Thomas ^a   Jørgensen, Mikkel ^a   Krebs, Frederik C ^a   Niggemann, Michael ^b   Zimmermann, Klaus ^c   Liehr, Andreas W ^c  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c UNIVERSITY OF FREIBURG   (Germany)

Author keywords

Full Metadata Format; lateral mapping; polymer solar cells; printed solar cells; Pyphant; reflection spectroscopy; slot die coated; thickness determination

Indexed keywords

FULL-METADATA FORMAT; POLYMER SOLAR CELLS; PYPHANT; REFLECTION SPECTROSCOPY; SLOT-DIE COATED; THICKNESS DETERMINATION;

ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; ALGORITHMS; DIGITAL STORAGE; GLASS; MAPPING; METADATA; PLASTIC COATINGS; POLYETHYLENE TEREPHTHALATES; SPIN COATING; SUBSTRATES; THIOPHENE; TIN OXIDES;

SOLAR CELLS;

EID: 84878182522     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.1190     Document Type: Article

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