Analysis of incomplete charge transfer effects in a CMOS image sensor

Journal of Semiconductors

Volumn 34, Issue 5, 2013, Pages

  Han, Liqiang ^a   Yao, Suying ^a   Xu, Jiangtao ^a   Xu, Chao ^a   Gao, Zhiyuan ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

charge transfer; CMOS image sensor; nonlinearity; pinned photodiode; shot noise

Indexed keywords

CMOS IMAGE SENSOR; EMISSION CURRENT; NOISE VARIATIONS; PHOTORESPONSE MODEL; PINNED PHOTODIODES; PIXEL SIZE; READ-OUT CIRCUIT; TREND PREDICTION;

CHARGE TRANSFER; CONTROL NONLINEARITIES; DIGITAL CAMERAS; SHOT NOISE;

PIXELS;

EID: 84878118408     PISSN: 16744926     EISSN: None     Source Type: Journal    
DOI: 10.1088/1674-4926/34/5/054009     Document Type: Article

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