-
1
-
-
0038856989
-
-
1:CAS:528:DyaK1cXisVGqsb4%3D
-
Edigaryan, A.A. and Polukarov, Yu.M.; Prot. Met.; 1998, vol. 34, no. 2, p. 95.
-
(1998)
Prot. Met.
, vol.34
, Issue.2
, pp. 95
-
-
Edigaryan, A.A.1
Polukarov, Y.2
-
2
-
-
0032667680
-
-
1:CAS:528:DyaK1MXhtlWksrk%3D 10.1002/(SICI)1097-0134(19990401)35:1<1: AID-PROT1>3.0.CO;2-2
-
Edigaryan, A.A. and Polukarov, Yu.M.; Prot. Met.; 1999, vol. 35, no. 1, p. 1.
-
(1999)
Prot. Met.
, vol.35
, Issue.1
, pp. 1
-
-
Edigaryan, A.A.1
Polukarov, Y.2
-
3
-
-
0007234589
-
-
1:CAS:528:DyaK1MXkslChtr8%3D
-
Kudryavtsev, V.N.; Vinokurov, E.G.; and Kuznetsov, V.V.; Gal'vanotekh. Obrab. Poverkhn.; 1998, vol. 6, no. 1, p. 24.
-
(1998)
Gal'Vanotekh. Obrab. Poverkhn.
, vol.6
, Issue.1
, pp. 24
-
-
Kudryavtsev, V.N.1
Vinokurov, E.G.2
Kuznetsov, V.V.3
-
4
-
-
0035599596
-
-
1:CAS:528:DC%2BD3MXmtFegtL4%3D 10.1023/A:1016712616902
-
Kuznetsov, V.V.; Vinokurov, E.G.; and Kudryavtsev, V.N.; Russ. J. Electrochem.; 2001, vol. 37, p. 699.
-
(2001)
Russ. J. Electrochem.
, vol.37
, pp. 699
-
-
Kuznetsov, V.V.1
Vinokurov, E.G.2
Kudryavtsev, V.N.3
-
5
-
-
0042381215
-
-
Hong, G.; Siow, K.S.; Zhiqiang, G.; and Hsieh, A.K.; Plat. Surf. Finish.; 2001, vol. 88, no. 3, p. 69.
-
(2001)
Plat. Surf. Finish.
, vol.88
, Issue.3
, pp. 69
-
-
Hong, G.1
Siow, K.S.2
Zhiqiang, G.3
Hsieh, A.K.4
-
6
-
-
0037146996
-
-
1:CAS:528:DC%2BD38Xpt12gurk%3D 10.1016/S0013-4686(02)00678-3
-
Song, Y.B. and Chin, D.-T.; Electrochim. Acta, 2002, vol. 48, p. 349.
-
(2002)
Electrochim. Acta
, vol.48
, pp. 349
-
-
Song, Y.B.1
Chin, D.-T.2
-
7
-
-
33751502534
-
-
1:CAS:528:DC%2BD28Xht1Gmt77K 10.1134/S0033173206060075
-
Danilov, F.I.; Protsenko, V.S.; and Butyrina, T.E.; et al.; Prot. Met.; 2006, vol. 42, p. 560.
-
(2006)
Prot. Met.
, vol.42
, pp. 560
-
-
Danilov, F.I.1
Protsenko, V.S.2
Butyrina, T.E.3
-
8
-
-
81855228811
-
-
1:CAS:528:DC%2BC3MXhtFyjsLbK 10.1134/S2070205111050066
-
Danilov, F.I.; Protsenko, V.S.; and Butyrina, T.E.; et al.; Prot. Met. Phys. Chem. Surf.; 2011, vol. 47, p. 598.
-
(2011)
Prot. Met. Phys. Chem. Surf.
, vol.47
, pp. 598
-
-
Danilov, F.I.1
Protsenko, V.S.2
Butyrina, T.E.3
-
9
-
-
79957892469
-
-
1:CAS:528:DC%2BC3MXovVCgtbc%3D 10.1016/S0026-0576(11)80066-8
-
Protsenko, V.S.; Gordiienko, V.O.; Danilov, F.I.; and Kwon, S.C.; Metal Finish.; 2011, vol. 109, nos. 4-5, p. 33.
-
(2011)
Metal Finish.
, vol.109 S.4-5
, pp. 33
-
-
Protsenko, V.S.1
Gordiienko, V.O.2
Danilov, F.I.3
Kwon, S.C.4
-
10
-
-
3543026870
-
-
1:CAS:528:DC%2BD2cXjtV2rsLc%3D 10.1023/B:RUEL.0000023928.39077.6f
-
Vykhodtseva, L.N.; Edigaryan, A.A.; Lubnin, E.N.; Polukarov, Yu.M.; and Safonov, V.A.; Russ. J. Electrochem.; 2004, vol. 40, p. 387.
-
(2004)
Russ. J. Electrochem.
, vol.40
, pp. 387
-
-
Vykhodtseva, L.N.1
Edigaryan, A.A.2
Lubnin, E.N.3
Polukarov, Y.4
Safonov, V.A.5
-
11
-
-
2442546550
-
-
1:CAS:528:DC%2BD2cXjvVekt74%3D 10.1016/j.surfcoat.2003.09.069
-
Kwon, S.C.; Kim, M.; Park, S.U.; Kim, D.Y.; Kim, D.; Nam, K.S.; and Choi, Y.; Surf. Coat. Technol.; 2004, vol. 183, p. 151.
-
(2004)
Surf. Coat. Technol.
, vol.183
, pp. 151
-
-
Kwon, S.C.1
Kim, M.2
Park, S.U.3
Kim, D.Y.4
Kim, D.5
Nam, K.S.6
Choi, Y.7
-
12
-
-
33744740344
-
-
1:CAS:528:DC%2BD28XkslWgsb0%3D 10.1007/s10800-005-9105-8
-
Surviliene, S.; Nivinskiene, O.; Cesuniene, A.; and Selskis, A.; J. Appl. Electrochem.; 2006, vol. 36, p. 649.
-
(2006)
J. Appl. Electrochem.
, vol.36
, pp. 649
-
-
Surviliene, S.1
Nivinskiene, O.2
Cesuniene, A.3
Selskis, A.4
-
13
-
-
34248353131
-
-
1:CAS:528:DC%2BD2sXlsFajtrY%3D 10.1016/j.apsusc.2007.01.122
-
Surviliene, S.; Jasulaitiene, V.; Nivinskiene, O.; and Cesuniene, A.; Appl. Surf. Sci.; 2007, vol. 253, p. 6738.
-
(2007)
Appl. Surf. Sci.
, vol.253
, pp. 6738
-
-
Surviliene, S.1
Jasulaitiene, V.2
Nivinskiene, O.3
Cesuniene, A.4
-
14
-
-
0037025095
-
-
1:CAS:528:DC%2BD38XkslSju78%3D 10.1016/S0013-4686(02)00163-9
-
Edigaryan, A.A.; Safonov, V.A.; Lubnin, E.N.; Vykhodtseva, L.N.; and Chusova, G.E.; Electrochim. Acta, 2002, vol. 47, p. 2775.
-
(2002)
Electrochim. Acta
, vol.47
, pp. 2775
-
-
Edigaryan, A.A.1
Safonov, V.A.2
Lubnin, E.N.3
Vykhodtseva, L.N.4
Chusova, G.E.5
-
15
-
-
79952742808
-
-
1:CAS:528:DC%2BC3MXhs1ansLw%3D 10.1016/j.surfcoat.2010.12.010
-
Huang, C.A.; Liu, Y.W.; Yu, C.; and Yang, C.C.; Surf. Coat. Technol.; 2011, vol. 205, p. 3461.
-
(2011)
Surf. Coat. Technol.
, vol.205
, pp. 3461
-
-
Huang, C.A.1
Liu, Y.W.2
Yu, C.3
Yang, C.C.4
-
16
-
-
77950916969
-
-
1:CAS:528:DC%2BC3cXkvVOjsbk%3D 10.1016/j.jallcom.2010.02.101
-
Ghaziof, S.; Golozar, M.A.; and Raeissi, K.; J. Alloys Compd.; 2010, vol. 496, p. 164.
-
(2010)
J. Alloys Compd.
, vol.496
, pp. 164
-
-
Ghaziof, S.1
Golozar, M.A.2
Raeissi, K.3
-
17
-
-
78649740073
-
-
1:CAS:528:DC%2BC3cXhsFWmurrF 10.1016/j.surfcoat.2010.08.123
-
Ghaziof, S.; Raeissi, K.; and Golozar, M.A.; Surf. Coat. Technol.; 2010, vol. 205, p. 2174.
-
(2010)
Surf. Coat. Technol.
, vol.205
, pp. 2174
-
-
Ghaziof, S.1
Raeissi, K.2
Golozar, M.A.3
-
18
-
-
33749528317
-
-
1:CAS:528:DC%2BD28XhtVOnt77K 10.1016/j.electacta.2006.07.038
-
Zeng, Z.; Wang, L.; Liang, A.; and Zhang, J.; Electrochim. Acta, 2006, vol. 52, p. 1366.
-
(2006)
Electrochim. Acta
, vol.52
, pp. 1366
-
-
Zeng, Z.1
Wang, L.2
Liang, A.3
Zhang, J.4
-
19
-
-
65649148338
-
-
1:CAS:528:DC%2BD1MXmtlamsr8%3D 10.1016/j.tsf.2009.03.188
-
Huang, C.A.; Liu, Y.W.; and Chuang, C.H.; Thin Solid Films, 2009, vol. 517, p. 4902.
-
(2009)
Thin Solid Films
, vol.517
, pp. 4902
-
-
Huang, C.A.1
Liu, Y.W.2
Chuang, C.H.3
-
20
-
-
67349218421
-
-
1:CAS:528:DC%2BD1MXmtVWjtr8%3D 10.1016/j.surfcoat.2009.03.010
-
Huang, C.A.; Lieu, U.W.; and Chuang, C.H.; Surf. Coat. Technol.; 2009, vol. 203, p. 2921.
-
(2009)
Surf. Coat. Technol.
, vol.203
, pp. 2921
-
-
Huang, C.A.1
Lieu, U.W.2
Chuang, C.H.3
-
21
-
-
33846096791
-
-
Safonov, V.A.; Vykhodtseva, L.N.; Polukarov, Y.M.; Safonova, O.V.; Smolentsev, G.; Sikora, M.; Eeckhout, S.G.; and Glatzel, P.; J. Phys. Chem. B, vol. 110, p. 23192.
-
J. Phys. Chem. B
, vol.110
, pp. 23192
-
-
Safonov V., .A.1
Vykhodtseva L., .N.2
Polukarov Y., .M.3
Safonova O., .V.4
Smolentsev, G.5
Sikora, M.6
Eeckhout S., .G.7
Glatzel, P.8
-
22
-
-
79957881444
-
-
1:CAS:528:DC%2BC3MXmvFyhtL0%3D 10.1016/j.apsusc.2011.04.095
-
Danilov, F.I.; Protsenko, V.S.; Gordiienko, V.O.; Kwon, S.C.; Lee, J.Y.; and Kim, M.; Appl. Surf. Sci.; 2011, vol. 257, p. 8048.
-
(2011)
Appl. Surf. Sci.
, vol.257
, pp. 8048
-
-
Danilov, F.I.1
Protsenko, V.S.2
Gordiienko, V.O.3
Kwon, S.C.4
Lee, J.Y.5
Kim, M.6
-
23
-
-
80054043549
-
-
1:CAS:528:DC%2BC3MXhtlaju73N 10.1016/j.tsf.2011.07.036
-
Protsenko, V.S.; Danilov, F.I.; Gordiienko, V.O.; Kwon, S.C.; Kim, M.; and Lee, J.Y.; Thin Solid Films, 2011, vol. 520, p. 380.
-
(2011)
Thin Solid Films
, vol.520
, pp. 380
-
-
Protsenko, V.S.1
Danilov, F.I.2
Gordiienko, V.O.3
Kwon, S.C.4
Kim, M.5
Lee, J.Y.6
-
24
-
-
78650029089
-
-
1:CAS:528:DC%2BC3cXhsVWgsL7F 10.1016/j.electacta.2010.08.108
-
Safonova, O.V.; Vykhodtseva, L.N.; Polyakov, N.A.; Swarbrick, J.C.; Sikora, M.; Glatzel, P.; and Safonov, V.A.; Electrochim. Acta, 2010, vol. 56, p. 145.
-
(2010)
Electrochim. Acta
, vol.56
, pp. 145
-
-
Safonova, O.V.1
Vykhodtseva, L.N.2
Polyakov, N.A.3
Swarbrick, J.C.4
Sikora, M.5
Glatzel, P.6
Safonov, V.A.7
-
25
-
-
55049091784
-
-
1:CAS:528:DC%2BD1cXhtVGkur%2FK 10.1134/S1023193508080016
-
Vykhodtseva, L.N.; Kulakova, I.I.; and Safonov, V.A.; Russ. J. Electrochem.; 2008, vol. 44, p. 877.
-
(2008)
Russ. J. Electrochem.
, vol.44
, pp. 877
-
-
Vykhodtseva, L.N.1
Kulakova, I.I.2
Safonov, V.A.3
-
26
-
-
80155131166
-
-
1:CAS:528:DC%2BC3MXhs1ChurbF 10.1179/1743294410Y.0000000019
-
Protsenko, V.S.; Gordiienko, V.O.; Danilov, F.I.; Kwon, S.C.; Kim, M.; and Lee, J.Y.; Surf. Eng.; 2011, vol. 27, p. 690.
-
(2011)
Surf. Eng.
, vol.27
, pp. 690
-
-
Protsenko, V.S.1
Gordiienko, V.O.2
Danilov, F.I.3
Kwon, S.C.4
Kim, M.5
Lee, J.Y.6
-
27
-
-
33751547205
-
-
1:CAS:528:DyaL2sXlsVeltrY%3D
-
Danilov, F.I.; Velichenko, A.B.; Loboda, S.M.; and Kalinovskaya, S.E.; Elektrokhimiya, 1987, vol. 23, p. 988.
-
(1987)
Elektrokhimiya
, vol.23
, pp. 988
-
-
Danilov, F.I.1
Velichenko, A.B.2
Loboda, S.M.3
Kalinovskaya, S.E.4
-
30
-
-
79953231600
-
-
1:CAS:528:DC%2BC3MXjvVOkurc%3D 10.1016/j.jallcom.2011.02.009
-
Li, Y.; Gao, Y.; Xiao, B.; Min, T.; Yang, Y.; Ma, Sh.; and Yi, D.; J. Alloys Compd.; 2011, vol. 509, p. 5242.
-
(2011)
J. Alloys Compd.
, vol.509
, pp. 5242
-
-
Li, Y.1
Gao, Y.2
Xiao, B.3
Min, T.4
Yang, Y.5
Ma, S.6
Yi, D.7
-
31
-
-
0042209168
-
-
Metallurgiya Moscow (Carbides)
-
Kosolapova, T.Ya.; Karbidy (Carbides), Moscow: Metallurgiya, 1968.
-
(1968)
Karbidy
-
-
Kosolapova, T.1
-
32
-
-
41949094176
-
-
1:CAS:528:DyaL1MXhvVWmsL8%3D 10.1016/0013-4686(89)87017-3
-
Szynkarczuk, J.; Drela, I.; and Kubicki, J.; Electrochim. Acta, 1989, vol. 34, p. 399.
-
(1989)
Electrochim. Acta
, vol.34
, pp. 399
-
-
Szynkarczuk, J.1
Drela, I.2
Kubicki, J.3
-
33
-
-
42349112609
-
-
1:CAS:528:DC%2BD1cXkslKjsLo%3D 10.1134/S1023193508030014
-
Korshunov, V.N.; Safonov, V.A.; and Vykhodtseva, L.N.; Russ. J. Electrochem.; 2008, vol. 44, p. 255.
-
(2008)
Russ. J. Electrochem.
, vol.44
, pp. 255
-
-
Korshunov, V.N.1
Safonov, V.A.2
Vykhodtseva, L.N.3
-
34
-
-
0035343561
-
-
1:CAS:528:DC%2BD3MXksFCntL4%3D 10.1023/A:1010490126064
-
Danilov, F.I. and Protsenko, V.S.; Prot. Met.; 2001, vol. 37, p. 223.
-
(2001)
Prot. Met.
, vol.37
, pp. 223
-
-
Danilov, F.I.1
Protsenko, V.S.2
-
35
-
-
0035594702
-
-
1:CAS:528:DC%2BD3MXmtFegtL8%3D 10.1023/A:1016764600973
-
Danilov, F.I.; Protsenko, V.S.; and Butyrina, T.E.; Russ. J. Electrochem.; 2001, vol. 37, p. 704.
-
(2001)
Russ. J. Electrochem.
, vol.37
, pp. 704
-
-
Danilov, F.I.1
Protsenko, V.S.2
Butyrina, T.E.3
-
36
-
-
67649213466
-
-
1:CAS:528:DC%2BD1MXnslKgsbg%3D 10.1016/j.electacta.2009.04.072
-
Protsenko, V. and Danilov, F.; Electrochim. Acta, 2009, vol. 54, p. 5666.
-
(2009)
Electrochim. Acta
, vol.54
, pp. 5666
-
-
Protsenko, V.1
Danilov, F.2
-
37
-
-
34547622634
-
-
1:CAS:528:DC%2BD2sXosVKntbg%3D 10.1134/S0033173207040145
-
Protsenko, V.S.; Butyrina, T.E.; and Danilov, F.I.; Prot. Met.; 2007, vol. 43, p. 398.
-
(2007)
Prot. Met.
, vol.43
, pp. 398
-
-
Protsenko, V.S.1
Butyrina, T.E.2
Danilov, F.I.3
-
38
-
-
79957638287
-
-
10.1016/j.microc.2011.02.017
-
Phuong, N.V.; Kwon, S.-C.; Lee, J.-Y.; et al.; Microchem. J.; 2011, vol. 99, p. 7.
-
(2011)
Microchem. J.
, vol.99
, pp. 7
-
-
Phuong, N.V.1
Kwon, S.-C.2
Lee, J.-Y.3
-
41
-
-
84858732721
-
-
1:CAS:528:DC%2BC38XksVerur0%3D 10.1016/j.elecom.2012.02.013
-
Protsenko, V.S.; Gordiienko, V.O.; and Danilov, F.I.; Electrochem. Commun.; 2012, vol. 17, p. 85.
-
(2012)
Electrochem. Commun.
, vol.17
, pp. 85
-
-
Protsenko, V.S.1
Gordiienko, V.O.2
Danilov, F.I.3
-
42
-
-
0037031511
-
-
1:CAS:528:DC%2BD38XntFyhtbs%3D 10.1016/S0022-0728(02)00766-0
-
Gileadi, E.; J. Electroanal. Chem.; 2002, vol. 532, p. 181.
-
(2002)
J. Electroanal. Chem.
, vol.532
, pp. 181
-
-
Gileadi, E.1
-
43
-
-
80053109440
-
-
1:CAS:528:DC%2BC3MXht1WmurnF 10.1016/j.jelechem.2011.01.025
-
Gileadi, E.; J. Electroanal. Chem.; 2011, vol. 660, p. 247.
-
(2011)
J. Electroanal. Chem.
, vol.660
, pp. 247
-
-
Gileadi, E.1
|