Direct observation of nanometer-scale Joule and Peltier effects in phase change memory devices

Applied Physics Letters

Volumn 102, Issue 19, 2013, Pages

  Grosse, Kyle L ^a   Xiong, Feng ^a,b   Hong, Sungduk ^a   King, William P ^a,b   Pop, Eric ^a,b  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT CROWDING EFFECT; DIRECT OBSERVATIONS; ELECTRICAL MEASUREMENT; ENERGY-EFFICIENT DESIGN; IN-PHASE; NANO-METER-SCALE; TEMPERATURE RESOLUTION; TEMPERATURE RISE;

GERMANIUM; THICK FILMS;

PHASE CHANGE MEMORY;

EID: 84877939824     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4803172     Document Type: Article

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