Using a non-monochromatic microbeam for serial snapshot crystallography

Journal of Applied Crystallography

Volumn 46, Issue 3, 2013, Pages 791-794

  Dejoie, Catherine ^a,b   Mccusker, Lynne B ^a   Baerlocher, Christian ^a   Abela, Rafael ^b   Patterson, Bruce D ^b   Kunz, Martin ^c   Tamura, Nobumichi ^c  

^a ETH ZURICH   (Switzerland)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

diffraction; stationary crystals; X ray free electron lasers

Indexed keywords

ADVANCED LIGHT SOURCE; MFI-TYPE ZEOLITE; MICRODIFFRACTIONS; MONOCHROMATIC RADIATION; PARTIAL REFLECTION; REFLECTION INTENSITY; STRUCTURAL STUDIES; X-RAY FREE ELECTRON LASERS;

CRYSTALLINE MATERIALS; CRYSTALLOGRAPHY; DIFFRACTION; LIGHT SOURCES; X RAY LASERS;

BANDWIDTH;

EID: 84877848167     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889813005888     Document Type: Article

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