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Volumn 2, Issue , 2006, Pages 1291-1296
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Using image registration and alignment to compare alternative 2D measurements
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Author keywords
2D profile measurement; Image registration
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Indexed keywords
ALGORITHM DEVELOPMENT;
AUTOMATIC REGISTRATION;
IMAGE REGISTRATION ALGORITHM;
PROFILE MEASUREMENT;
REGISTRATION ALGORITHMS;
REGISTRATION METHODS;
SUB-PIXEL REGISTRATIONS;
SURFACE PROFILE MEASUREMENTS;
ALGORITHMS;
ALIGNMENT;
IMAGE REGISTRATION;
ITERATIVE METHODS;
MEASUREMENTS;
PLANNING;
SUSTAINABLE DEVELOPMENT;
UNITS OF MEASUREMENT;
TWO DIMENSIONAL;
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EID: 84877726168
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (8)
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