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Volumn , Issue , 2010, Pages 37-66

Surface texture characterization and evaluation related to machining

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[No Author keywords available]

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EID: 84877580546     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-1-84882-874-2_2     Document Type: Chapter
Times cited : (77)

References (22)
  • 1
    • 0003748182 scopus 로고    scopus 로고
    • Taylor Hobson Publishing Ltd, Leicester
    • Dagnall -. (1996) Exploring Surface Texture, Taylor Hobson Publishing Ltd, Leicester
    • (1996) Exploring Surface Texture
    • Dagnall1
  • 2
    • 0004214815 scopus 로고    scopus 로고
    • Institute of Physics Publishing for Rank Taylor-Hobson Co., Bristol
    • Whitehouse D (1996) Handbook of Surface Metrology, Institute of Physics Publishing for Rank Taylor-Hobson Co., Bristol
    • (1996) Handbook of Surface Metrology
    • Whitehouse, D.1
  • 3
    • 0042475885 scopus 로고    scopus 로고
    • Chapter 16: "Roughness, Waviness and Primary Profile" by L. Blunt and X. Jiang, Warsaw University Printing House, Warsaw
    • Humienny Z. (ed.) (2001) Geometrical Product Specifications, Chapter 16: "Roughness, Waviness and Primary Profile" by L. Blunt and X. Jiang, Warsaw University Printing House, Warsaw
    • (2001) Geometrical Product Specifications
    • Humienny, Z.1
  • 5
    • 0032068093 scopus 로고    scopus 로고
    • The motif-method (iso 12085) - A suitable description for functional, manufactural and metrological requirements
    • Dietzsch M., Papenfluss K, Hartmann, T. (1998) The MOTIF-method (ISO 12085) - A suitable description for functional, manufactural and metrological requirements, International Journal of Machine Tools and Manufacture, 38, No 5-6, 625-632
    • (1998) International Journal of Machine Tools and Manufacture , vol.38 , Issue.5-6 , pp. 625-632
    • Dietzsch, M.1    Papenfluss, K.2    Hartmann, T.3
  • 7
    • 0030105613 scopus 로고    scopus 로고
    • Calculation of the fractal dimensions of machined surface profiles
    • Hasegawa M, Liu, J, Okuda K, Nunobiki M (1996) Calculation of the fractal dimensions of machined surface profiles, Wear, 192, 40-45
    • (1996) Wear , vol.192 , pp. 40-45
    • Hasegawa, M.1    Liu, J.2    Okuda, K.3    Nunobiki, M.4
  • 9
    • 0033237775 scopus 로고    scopus 로고
    • Fractal characterization of the anisotropy of rough surfaces
    • Thomas T R, Rosen B-G, Amini N, (1999) Fractal characterization of the anisotropy of rough surfaces, Wear, 232, 41-50
    • (1999) Wear , vol.232 , pp. 41-50
    • Thomas T, R.1    Rosen, B.-G.2    Amini, N.3
  • 12
    • 0015562182 scopus 로고
    • The effect of feed rate and of tool nose radius on the roughness of oblique finish turned surfaces
    • Petropoulos P G (1973) The effect of feed rate and of tool nose radius on the roughness of oblique finish turned surfaces, Wear, 23, 299-310
    • (1973) Wear , vol.23 , pp. 299-310
    • Petropoulos P, G.1
  • 17
    • 0022046634 scopus 로고
    • Multi-parameter representation of surface roughness
    • Nowicki B (1985) Multi-parameter representation of surface roughness, Wear, 102, 161-176
    • (1985) Wear , vol.102 , pp. 161-176
    • Nowicki, B.1
  • 20
    • 0007726618 scopus 로고
    • Investigation of the surface typology
    • Peklenik J (1967) Investigation of the surface typology, Annals of the CIRP, Vol. 15
    • (1967) Annals of the CIRP , vol.15
    • Peklenik, J.1
  • 21
    • 84889996802 scopus 로고
    • Beta functions for surface typologie
    • Whitehouse D J (1978) Beta functions for surface typologie-, Annals of the CIRP, 27, No. 1, 539-553
    • (1978) Annals of the CIRP , vol.27 , Issue.1 , pp. 539-553
    • Whitehouse D, J.1
  • 22
    • 0018673508 scopus 로고
    • Assessment of surface typology analysis techniques
    • Peters J, Vanherck P, Sastrodinoto M. (1979) Assessment of surface typology analysis techniques, Annals of the CIRP, 28, No. 25, 39-553
    • (1979) Annals of the CIRP , vol.28 , Issue.25 , pp. 39-553
    • Peters, J.1    Vanherck, P.2    Sastrodinoto, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.