Development of fast scanning microscopic XAFS measurement system

Journal of Physics: Conference Series

Volumn 430, Issue 1, 2013, Pages

  Tsuji, T ^a   Uruga, T ^a,b   Nitta, K ^a   Kawamura, N ^a   Mizumaki, M ^a   Suzuki, M ^a,d   Sekizawa, O ^b   Ishiguro, N ^c   Tada, M ^c   Ohashi, H ^a   Yamazaki, H ^a,d   Yumoto, H ^a,d   Koyama, T ^a,d   Senba, Y ^a,d   Takeuchi, T ^a,d   Terada, Y ^a,d   Nariyama, N ^a,d   Takeshita, K ^a,d   Fujiwara, A ^a   Goto, S ^a,d   Yamamoto, M ^a,d   Takata, M ^a,d   Ishikawa, T ^a,d   more..

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^c INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

^d RIKEN HARIMA INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; NANOTECHNOLOGY; SCANNING; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY SPECTROSCOPY;

FAST SCANNING; MEASUREMENT SYSTEM; SINGLE CATALYST; SPATIAL RESOLUTION; X RAY ABSORPTION FINE STRUCTURES; X RAY FLUORESCENCE; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XAFS MEASUREMENTS;

X RAY ABSORPTION;

EID: 84877360003     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/430/1/012019     Document Type: Conference Paper

References (2)

1. Tada M, Ishiguro N, Uruga T, Tanida H, Terada Y, Nagamatsu S, Iwasawa Y, and Ohkoshi S 2011 Phys. Chem. Chem. Phys. 13 14910-14913
2. Koyama T, Yumoto H, Terada Y, Suzuki M, Kawamura N, Mizumaki M, Nariyama N, Matsushita T, Ishizawa Y, Furukawa Y, Ohata T, Yamazaki H, Takeuchi T, Senba Y, Matsuzaki Y, Tanaka M, Shimizu Y, Kishimoto H, Miura T, Kimura H, Takeshita K, Ohashi H, Yamamoto M, Goto S, Takata M, and Ishikawa T 2011 Proc. of SPIE 8139 81390I