Structural study of the Cu2+-loaded copper hexacyanoferrate electrode deposited on indium tin oxide substrate

Journal of Physics: Conference Series

Volumn 430, Issue 1, 2013, Pages

  Giorgetti, M ^a   Aquilanti, G ^b   Minicucci, M ^c  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b SINCROTRONE TRIESTE   (Italy)

^c UNIVERSITY OF CAMERINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; CHARACTERIZATION; COPPER; ELECTRODES; INDIUM; IRON COMPOUNDS; TIN; X RAY ABSORPTION; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

COPPER HEXACYANOFERRATE; ELECTROCHEMICAL CHARACTERIZATIONS; INDIUM TIN OXIDE SUBSTRATES; ITO (INDIUM-TIN OXIDE); MULTIPLE SCATTERING EFFECT; STRUCTURAL CHARACTERIZATION; STRUCTURAL MODELING; STRUCTURAL STUDIES;

TIN OXIDES;

EID: 84877358207     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/430/1/012049     Document Type: Conference Paper

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