On the relation between X-ray photoelectron spectroscopy and XAFS

Journal of Physics: Conference Series

Volumn 430, Issue 1, 2013, Pages

  Martensson N ^a   Soderstrom J ^a   Svensson, S ^a   Travnikova, O ^b   Patanen, M ^b   Miron, C ^b   Saethre L J ^c   Borve, K J ^c   Thomas, T D ^d   Kas, J J ^e   Vila, F D ^e   Rehr, J J ^e  

^a UPPSALA UNIVERSITY   (Sweden)

^b SYNCHROTRON SOLEIL   (France)

^c UNIVERSITY OF BERGEN   (Norway)

^d OREGON STATE UNIVERSITY   (United States)

^e UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; CARBON; ELECTRONIC STATES; INELASTIC SCATTERING; IONIZATION; PHOTOELECTRONS; PHOTOIONIZATION; PHOTONS; X RAY ABSORPTION;

CHEMICAL SENSITIVITY; CORE LEVEL PHOTOELECTRONS; INELASTIC SCATTERING PROCESS; MOLECULAR CALCULATIONS; MULTIPLE-SCATTERING THEORY; PHOTOELECTRON INTENSITIES; STOICHIOMETRIC RATIO; UNOCCUPIED ELECTRONIC STATE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84877357133     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/430/1/012131     Document Type: Conference Paper

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