Collecting optical coherence elastography depth profiles with a micromachined cantilever probe

Optics Letters

Volumn 38, Issue 9, 2013, Pages 1476-1478

  Chavan, Dhwajal ^a   Mo, Jianhua ^a   De Groot, Mattijs ^a   Meijering, Anna ^a   De Boer, Johannes F ^a   Iannuzzi, Davide ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); CANTILEVER PROBE; MICROMACHINED CANTILEVER; NM RESOLUTION; OPTICAL COHERENCE ELASTOGRAPHY; OPTICAL-FIBER INTERFEROMETRY; SMALL FOOTPRINTS; SUBSURFACE LAYER;

ATOMIC FORCE MICROSCOPY; INDENTATION; NANOCANTILEVERS; OPTICAL FIBERS; PROBES;

OPTICAL TOMOGRAPHY;

EID: 84877150770     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.38.001476     Document Type: Article

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