메뉴 건너뛰기




Volumn 87, Issue 16, 2013, Pages

Graphene on amorphous HfO2 surface: An ab initio investigation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84877038852     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.87.165307     Document Type: Article
Times cited : (12)

References (32)
  • 4
    • 77956212768 scopus 로고    scopus 로고
    • APPLAB 0003-6951 10.1063/1.3483130
    • V. E. Dorgan, M.-H. Bar, and E. Pop, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.3483130 97, 082112 (2010).
    • (2010) Appl. Phys. Lett. , vol.97 , pp. 082112
    • Dorgan, V.E.1    Bar, M.-H.2    Pop, E.3
  • 9
    • 77957156573 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.105.126601
    • K. Zou, X. Hong, D. Keefer, and J. Zhu, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.105.126601 105, 126601 (2010).
    • (2010) Phys. Rev. Lett. , vol.105 , pp. 126601
    • Zou, K.1    Hong, X.2    Keefer, D.3    Zhu, J.4
  • 10
    • 77957839771 scopus 로고    scopus 로고
    • NNOTER 0957-4484 10.1088/0957-4484/21/33/335706
    • S. M. Song and B. J. Cho, Nanotechnology NNOTER 0957-4484 10.1088/0957-4484/21/33/335706 21, 335706 (2010).
    • (2010) Nanotechnology , vol.21 , pp. 335706
    • Song, S.M.1    Cho, B.J.2
  • 15
    • 0030190741 scopus 로고    scopus 로고
    • Efficiency of ab-initio total energy calculations for metals and semiconductors using a plane-wave basis set
    • DOI 10.1016/0927-0256(96)00008-0, PII S0927025696000080
    • G. Kresse and J. Furthmüller, Comput. Mater. Sci. CMMSEM 0927-0256 10.1016/0927-0256(96)00008-0 6, 15 (1996). (Pubitemid 126412269)
    • (1996) Computational Materials Science , vol.6 , Issue.1 , pp. 15-50
    • Kresse, G.1    Furthmuller, J.2
  • 16
    • 2442537377 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.54.11169
    • G. Kresse and J. Furthmüller, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.54.11169 54, 11169 (1996).
    • (1996) Phys. Rev. B , vol.54 , pp. 11169
    • Kresse, G.1    Furthmüller, J.2
  • 17
    • 20544463457 scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.41.7892
    • D. Vanderbilt, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.41.7892 41, 7892 (1990).
    • (1990) Phys. Rev. B , vol.41 , pp. 7892
    • Vanderbilt, D.1
  • 18
    • 4243943295 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.77.3865
    • J. P. Perdew, K. Burke, and M. Ernzerhof, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.77.3865 77, 3865 (1996).
    • (1996) Phys. Rev. Lett. , vol.77 , pp. 3865
    • Perdew, J.P.1    Burke, K.2    Ernzerhof, M.3
  • 19
    • 43449116069 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.77.172101
    • W. L. Scopel, A. J. R. da Silva, and A. Fazzio, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.77.172101 77, 172101 (2008).
    • (2008) Phys. Rev. B , vol.77 , pp. 172101
    • Scopel, W.L.1    Da Silva, A.J.R.2    Fazzio, A.3
  • 20
    • 33750559983 scopus 로고    scopus 로고
    • Semiempirical GGA-type density functional constructed with a long-range dispersion correction
    • DOI 10.1002/jcc.20495
    • S. Grimme, J. Comput. Chem. JCCHDD 0192-8651 10.1002/jcc.20495 27, 1787 (2006). (Pubitemid 44672561)
    • (2006) Journal of Computational Chemistry , vol.27 , Issue.15 , pp. 1787-1799
    • Grimme, S.1
  • 21
    • 79961106198 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.83.153413
    • K. Kamiya, N. Umezawa, and S. Okada, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.83.153413 83, 153413 (2011).
    • (2011) Phys. Rev. B , vol.83 , pp. 153413
    • Kamiya, K.1    Umezawa, N.2    Okada, S.3
  • 23
    • 79952389402 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.106.106801
    • N. T. Cuong, M. Otani, and S. Okada, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.106.106801 106, 106801 (2011).
    • (2011) Phys. Rev. Lett. , vol.106 , pp. 106801
    • Cuong, N.T.1    Otani, M.2    Okada, S.3
  • 25
    • 34547277537 scopus 로고    scopus 로고
    • Oxygen vacancies in high dielectric constant oxide-semiconductor films
    • DOI 10.1103/PhysRevLett.98.196101
    • S. Guha and V. Narayanan, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.98.196101 98, 196101 (2007). (Pubitemid 47139496)
    • (2007) Physical Review Letters , vol.98 , Issue.19 , pp. 196101
    • Guha, S.1    Narayanan, V.2
  • 28
    • 33947448165 scopus 로고
    • JACSAT 0002-7863 10.1021/ja01108a004
    • G. L. Humphrey, J. Am. Chem. Soc. JACSAT 0002-7863 10.1021/ja01108a004 75, 2806 (1953).
    • (1953) J. Am. Chem. Soc. , vol.75 , pp. 2806
    • Humphrey, G.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.