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Volumn , Issue , 2006, Pages

A cost-effective alternative technology for wafer bumping - Electroless Ni/Au UBM deposition and ultra fine pitch printing of solder paste

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATIVE TECHNOLOGIES; FLIP CHIP APPLICATIONS; LEAD-FREE SOLDER PASTE; MICROELECTRONICS PACKAGING; PRINTING EQUIPMENTS; SOLDER PASTE STENCIL PRINTING; SURFACE MOUNT ASSEMBLY; UNDER BUMP METALLIZATION;

EID: 84877032119     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (4)
  • 1
    • 1842842325 scopus 로고    scopus 로고
    • Technical challenges of stencil printing technology for ultra fine pitch flip chip bumping
    • Manessis, D. et al, "Technical challenges of stencil printing technology for ultra fine pitch flip chip bumping", Journal Microelectronics Reliability, vol. 44 (2004), pp. 797-803.
    • (2004) Journal Microelectronics Reliability , vol.44 , pp. 797-803
    • Manessis, D.1
  • 2
    • 2942724288 scopus 로고    scopus 로고
    • Stencil printing technology for 100 μm pitch flip chip bumping
    • Manessis, D. et al, "Stencil Printing Technology for 100 μm Pitch Flip Chip Bumping", The Global Assembly Journal for SMT Professionals, Vol., No. 2, (2004), pp. 10-14.
    • (2004) The Global Assembly Journal for SMT Professionals , Issue.2 , pp. 10-14
    • Manessis, D.1
  • 3
    • 0032643332 scopus 로고    scopus 로고
    • Electroless metal deposition for back-end wafer processes
    • May/June
    • A. Ostmann et al. "Electroless Metal Deposition for Back-End Wafer Processes", Advancing Microelectronics, pp. 23-26, May/June 1999
    • (1999) Advancing Microelectronics , pp. 23-26
    • Ostmann, A.1
  • 4
    • 1842842325 scopus 로고    scopus 로고
    • Technical challenges of stencil printing technology for ultra fine pitch flip chip bumping
    • Manessis, D. et al, "Technical challenges of stencil printing technology for ultra fine pitch flip chip bumping", Journal Microelectronics Reliability, vol. 44 (2004), pp. 797-803
    • (2004) Journal Microelectronics Reliability , vol.44 , pp. 797-803
    • Manessis, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.