Count data stochastic frontier models, with an application to the patents-R&D relationship

Journal of Productivity Analysis

Volumn 39, Issue 3, 2013, Pages 271-284

  Fé, Eduardo ^a   Hofler, Richard ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

Discrete data; Halton sequence; Local maximum likelihood; Maximum simulated likelihood; Stochastic frontier analysis

Indexed keywords

EID: 84876893920     PISSN: 0895562X     EISSN: 15730441     Source Type: Journal    
DOI: 10.1007/s11123-012-0286-y     Document Type: Article

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