Thermal dependence of optical properties of silver thin films studied by spectroscopic ellipsometry

AIP Conference Proceedings

Volumn 1447, Issue 1, 2012, Pages 673-674

  Sundari, S Tripura ^a   Dash, S ^a   Tyagi, A K ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

dielectric constant; Ellipsometry. Thin films

Indexed keywords

EID: 84876814747     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.4710182     Document Type: Conference Paper

References (3)

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