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Volumn 182, Issue 2, 2013, Pages 59-66

Automatic post-picking using MAPPOS improves particle image detection from cryo-EM micrographs

Author keywords

3D cryo EM density map; Classification ensemble; Electron microscopy; Machine learning; Particle picking

Indexed keywords

ALGORITHM; ARTICLE; CLASSIFIER; CRYOELECTRON MICROSCOPY; MACHINE LEARNING; PRIORITY JOURNAL; WORKLOAD;

EID: 84876722357     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2013.02.008     Document Type: Article
Times cited : (24)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.